Microscopy

Traditional optical microscopy has always required precise positioning. Modern high-resolution sensors used in non-optical microscopes (STM, AFM, SEM, etc.) require resolutions down to nanometres and below. nanoFaktur supplies nano-positioning systems for lenses, high-resolution scanning sensors and samples. All 6 degrees of freedom can be covered.

Objective-Positioners

SFS QuickFocus

150 µm
fast
compact
various adapters

SFS SlimFocus

200 µm
fast
compact
various adapters

SFS RangeFocus 100-600 µm

100/300/600 µm
compact
various adapters

SF_ StraightFocus 100-800 µm

100/400/800 µm
straight guided
capacitive or strain sensors

MegaFocus 1200 µm

1200 µm
compact
various adapters

Sample Stages Z

SPS Sample Z-Stages

Z Sample-Stages
150/600 µm
opt. sample holders

SPS Sample Z-Inserts

Z Insert-Stages
120/250/500 µm
opt. sample holders

Objective Adaptors

OBJ Objective Adaptors

Objective-Adapters
All standard-threads
Metric, Non-Metric, Hybrid

Why us?

We provide you with expert advice on the use of piezo technology in your application. Answers and quotes are provided quickly, as you speak directly to the experts. Delivery times are reasonable, even for modifications or special developments.

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